OFFER

Roltec has a well-equipped laboratory and an experimental production line for the production of photovoltaic cells in thin-film technology. Within these resources and thanks to a highly qualified team of specialists and scientists, we carry out tasks commissioned to external entities.

As part of commissioned tasks, we carry out commercially:

LABORATORY WORKS

Application of thin layers by thermal evaporation

Device: Moorfield MiniLabLT60A

Application of thin layers by magnetron sputtering

Device: Moorfield MiniLabLT60A

Application of thin layers using chemical baths

Device: Depending on requirements

Optical spectroscopy in the range of 380–1100nm

Device: Filmetrics F10-RT

Spectroscopic measurements in the integrating sphere

Device: Rera QE 5000

Quantum efficiency measurements of solar cells

Device: Rera QE 5000

Measurements of the elemental composition of substances using plasma spectroscopy

Device: Spectruma GD-OES

Surface morphology measurements (roughness, topography, step height)

Device: Filmetrics Profilm3D

Measurements of electrical parameters of high-resistance materials (conductivity, square resistance)

Device: Mitsubishi MCP-HT 450

Measurements of the efficiency of photovoltaic cells in STC (AM1.5G spectrum, A+AA class simulator)

Device: Enlitech SS-X160R

Microscopic observations — electron microscope, composition analysis using the EDS detector

Device: ThermoFischer InspectF

Measurements of current-voltage characteristics of semiconductor devices (diodes, cells, transistors, etc.)

Device: Keithely 2600 series

Surface condition analysis (activation energy)

Device: Kruss mobile surface analyzer

XRF measurements in the range of 0–50keV

Device: Spektro XEPOS III

Numerical analysis of the results of optical measurements (calculation of dielectric functions), electrical, morphology, etc.

Roltec proprietary software

Microscopic observations — electron microscope, SE or BSE mode (magnification, depending on the material up to 100,000x)

Device: ThermoFischer InspectF

Microscopic observations — optical microscope (up to 1500x, observations in light and dark field)

Device: Zeiss Axiolab 5

Computer modeling of semiconductor devices, processes and efficiency of solar cells

Roltec proprietary software

SERVICES ON PILOT PHOTOVOLTAIC LINE DEVICES

Laser structuring of thin layers using 532nm or 1064nm waves. xy accuracy<30um

Device: MASTER1 GSGP 532 picosecond laser

Glass lamination with EVA foil (up to 12mm thickness, maximum laminate thickness 50mm)

Device: Fangding Mekanika

Measurements of the efficiency of PV modules in the range of 0–150V, 0–2A, in STC conditions

Device: Hoenle SOL 2000 RF2 EPS

Measurements of the efficiency of PV modules (any range allowed by standards), under STC conditions

Device: Metrel 3108 Eurotest PV

Basic glass processing (max. format 120x60cm): cutting, edge blanking, drilling 5mm holes

Device: Drill Glass-tech WD‑1

Control and measurement tests of photovoltaic installations

Device: Metrel 3108 Eurotest PV

We invite you to cooperate! The details of orders, including costs, are discussed during individual conversations with the client.
Contact with the laboratory: +48 65 537 39 99 or biuro@roltec.pl

OFFER

Roltec has a well-equipped laboratory and an experimental production line for the production of photovoltaic cells in thin-film technology. Within these resources and thanks to a highly qualified team of specialists and scientists, we carry out tasks commissioned to external entities.

As part of commissioned tasks, we carry out commercially:

LABORATORY WORKS

Application of thin layers by thermal evaporation

Application of thin layers by magnetron sputtering

Application of thin layers using chemical baths

Optical spectroscopy in the range of 380–1100nm

Spectroscopic measurements in the integrating sphere

Quantum efficiency measurements of solar cells

Measurements of the elemental composition of substances using plasma spectroscopy

Surface morphology measurements (roughness, topography, step height)

Measurements of electrical parameters of high-resistance materials (conductivity, square resistance)

Measurements of the efficiency of photovoltaic cells in STC (AM1.5G spectrum, A+AA class simulator)

Microscopic observations — electron microscope, composition analysis using the EDS detector

Measurements of current-voltage characteristics of semiconductor devices (diodes, cells, transistors, etc.)

Surface condition analysis (activation energy)

XRF measurements in the range of 0–50keV

Numerical analysis of the results of optical measurements (calculation of dielectric functions), electrical, morphology, etc.

Microscopic observations — electron microscope, SE or BSE mode (magnification, depending on the material up to 100,000x)

Microscopic observations — optical microscope (up to 1500x, observations in light and dark field)

Computer modeling of semiconductor devices, processes and efficiency of solar cells

SERVICES ON PILOT PHOTOVOLTAIC LINE DEVICES

Laser structuring of thin layers using 532nm or 1064nm waves. xy accuracy<30um

Glass lamination with EVA foil (up to 12mm thickness, maximum laminate thickness 50mm)

Measurements of the efficiency of PV modules in the range of 0–150V, 0–2A, in STC conditions

Measurements of the efficiency of PV modules (any range allowed by standards), under STC conditions

Basic glass processing (max. format 120x60cm): cutting, edge blanking, drilling 5mm holes

Control and measurement tests of photovoltaic installations

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PROJEcts

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CONTACT

OFFER

As part of com­mis­sioned tasks, we carry out commercially:

LABORATORY WORKS

Applic­a­tion of thin lay­ers by thermal evaporation

Applic­a­tion of thin lay­ers by mag­net­ron sputtering

Applic­a­tion of thin lay­ers using chem­ic­al baths

Optic­al spec­tro­scopy in the range of 380–1100nm

Spec­tro­scop­ic meas­ure­ments in the integ­rat­ing sphere

Quantum effi­ciency meas­ure­ments of sol­ar cells

Meas­ure­ments of the ele­ment­al com­pos­i­tion of sub­stances using plasma spectroscopy

Sur­face mor­pho­logy meas­ure­ments (rough­ness, topo­graphy, step height)

Meas­ure­ments of elec­tric­al para­met­ers of high-res­ist­ance mater­i­als (con­duct­iv­ity, square resistance)

Meas­ure­ments of the effi­ciency of photo­vol­ta­ic cells in STC (AM1.5G spec­trum, A+AA class simulator)

Micro­scop­ic obser­va­tions — elec­tron micro­scope, com­pos­i­tion ana­lys­is using the EDS detector

Meas­ure­ments of cur­rent-voltage char­ac­ter­ist­ics of semi­con­duct­or devices (diodes, cells, tran­sist­ors, etc.)

Sur­face con­di­tion ana­lys­is (activ­a­tion energy)

XRF meas­ure­ments in the range of 0–50keV

Numer­ic­al ana­lys­is of the res­ults of optic­al meas­ure­ments (cal­cu­la­tion of dielec­tric func­tions), elec­tric­al, mor­pho­logy, etc.

Micro­scop­ic obser­va­tions — elec­tron micro­scope, SE or BSE mode (mag­ni­fic­a­tion, depend­ing on the mater­i­al up to 100,000x)

Micro­scop­ic obser­va­tions — optic­al micro­scope (up to 1500x, obser­va­tions in light and dark field)

Com­puter mod­el­ing of semi­con­duct­or devices, pro­cesses and effi­ciency of sol­ar cells

SERVICES ON PILOT PHOTOVOLTAIC LINE DEVICES

Laser struc­tur­ing of thin lay­ers using 532nm or 1064nm waves. xy accuracy<30um

Glass lam­in­a­tion with EVA foil (up to 12mm thick­ness, max­im­um lam­in­ate thick­ness 50mm)

Meas­ure­ments of the effi­ciency of PV mod­ules in the range of 0–150V, 0–2A, in STC conditions

Meas­ure­ments of the effi­ciency of PV mod­ules (any range allowed by stand­ards), under STC conditions

Basic glass pro­cessing (max. format 120x60cm): cut­ting, edge blank­ing, drilling 5mm holes

Con­trol and meas­ure­ment tests of photo­vol­ta­ic installations

START

PROJEcts

career

CONTACT

As part of commissioned tasks, we carry out commercially:

Application of thin layers by thermal evaporation

Application of thin layers by magnetron sputtering

Application of thin layers using chemical baths

Optical spectroscopy in the range of 380–1100nm

Spectroscopic measurements in the integrating sphere

Quantum efficiency measurements of solar cells

Measurements of the elemental composition of substances using plasma spectroscopy

Surface morphology measurements (roughness, topography, step height)

Measurements of electrical parameters of high-resistance materials (conductivity, square resistance)

Measurements of the efficiency of photovoltaic cells in STC (AM1.5G spectrum, A+AA class simulator)

Microscopic observations — electron microscope, composition analysis using the EDS detector

Measurements of current-voltage characteristics of semiconductor devices (diodes, cells, transistors, etc.)

Surface condition analysis (activation energy)

XRF measurements in the range of 0–50keV

Numerical analysis of the results of optical measurements (calculation of dielectric functions), electrical, morphology, etc.

Microscopic observations — electron microscope, SE or BSE mode (magnification, depending on the material up to 100,000x)

Microscopic observations — optical microscope (up to 1500x, observations in light and dark field)

Computer modeling of semiconductor devices, processes and efficiency of solar cells

Laser structuring of thin layers using 532nm or 1064nm waves. xy accuracy<30um

Glass lamination with EVA foil (up to 12mm thickness, maximum laminate thickness 50mm)

Measurements of the efficiency of PV modules in the range of 0–150V, 0–2A, in STC conditions

Measurements of the efficiency of PV modules (any range allowed by standards), under STC conditions

Basic glass processing (max. format 120x60cm): cutting, edge blanking, drilling 5mm holes

Control and measurement tests of photovoltaic installations